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VLSI Design and Test

VLSI Design and Test

Softcover - 9789811359491
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Beschreibung

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Details

Verlag Springer Singapore
Ersterscheinung 25. Januar 2019
Maße 23.5 cm x 15.5 cm
Gewicht 1101 Gramm
Format Softcover
ISBN-13 9789811359491
Seiten 722

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