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Three-Dimensional X-Ray Diffraction Microscopy

von Henning Friis Poulsen
Softcover - 9783662145432
213,99 €
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Hardcover - 9783540223306
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Hardcover - 9783540223306
213,99 €

Beschreibung

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Mapping Polycrystals and their Dynamics

Mapping Polycrystals and their Dynamics

Details

Verlag Springer Berlin
Ersterscheinung 03. Oktober 2013
Maße 23.5 cm x 15.5 cm
Gewicht 271 Gramm
Format Softcover
ISBN-13 9783662145432
Auflage Softcover reprint of the original 1st ed. 2004
Seiten 156

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