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Beschreibung
Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards.
In particular, addresses:
IEEE Std 1149.1 Digital Boundary-ScanIEEE Std 1149.4 Analog Boundary-ScanIEEE Std 1149.6 Advanced I/O TestingIEEE Std 1149.8.1 Passive Component TestingIEEE Std 1149.1-2013 The 2013 Revision of 1149.1IEEE Std 1532 In-System ConfigurationIEEE Std 1149.6-2015 The 2015 Revision of 1149.6
Details
| Verlag | Springer International Publishing |
| Ersterscheinung | 23. November 2015 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 1039 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783319011738 |
| Auflage | 4th ed. 2016 |
| Seiten | 552 |