✍️ 🧑‍🦱 💚 Autor:innen verdienen bei uns doppelt. Dank euch haben sie so schon 418.243 € mehr verdient. → Mehr erfahren 💪 📚 🙏

Synthetic Polymeric Membranes

von C. Y. Feng, K. C. Khulbe und Takeshi Matsuura
Hardcover - 9783540739937
106,99 €
  • Versandkostenfrei
Auf meine Merkliste
  • Hinweis: Print on Demand. Lieferbar in 7 Tagen.
  • Lieferzeit nach Versand: ca. 1-2 Tage
  • inkl. MwSt. & Versandkosten (innerhalb Deutschlands)

Weitere Formate

Softcover - 9783642093272
119,99 €

Autorenfreundlich Bücher kaufen?!

Weitere Formate

Softcover - 9783642093272
119,99 €

Beschreibung

Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on the exact kn- ledge of the morphology of a thin selective layer that exists at the surface of the m- brane. Te control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of only twen- ?ve years, AFM has ?rmly established its position as a method to characterize the membrane surface. Each chapter of this book includes information on basic principles, commercial applications, current research, and guidelines for future research. Each chapter is summarized at the end and contains a comprehensive list of references. Te introductory chapter gives a brief overview of synthetic polymeric m- branes and their applications both in industrial processes and in biomedical ?elds. It also gives an overview of studies on membrane surface morphology by various methods. Chapter ? deals with the synthesis of membranes, the properties of membranes, and the application of membranes. Te beginning also identi?es the three types of membranes (i.e., biological, synthetic, and theoretical) and their applications.

Characterization by Atomic Force Microscopy

Characterization by Atomic Force Microscopy

Details

Verlag Springer Berlin
Ersterscheinung 17. Dezember 2007
Maße 23.5 cm x 15.5 cm
Gewicht 494 Gramm
Format Hardcover
ISBN-13 9783540739937
Auflage 2008
Seiten 198