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Beschreibung
Thin film science has received tremendous attention in last six decades especially after the World war II. It is because of numerous and widespread applications of thin films in diverse fields such as electronic industries, micro-electronics and hybrid circuits, optical devices, sensors, superconductivity and recently high memory computer elements etc. This book titled as "The Study of Transport Properties of Bismuth Thin Films Using Physical Evaporation Technique" covers study of Bismuth film thickness and electrical resistivity. An attempt has been made to evaluate the electrical parameters such as bulk resistivity, mean free path of charge carriers and carrier concentration as a function of thickness.
Using Physical Evaporation Technique
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 26. Januar 2016 |
| Maße | 22 cm x 15 cm x 0.6 cm |
| Gewicht | 149 Gramm |
| Format | Softcover |
| ISBN-13 | 9783659833205 |
| Seiten | 88 |
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