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Beschreibung
This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.
Device Design, Process Integration, Characterization, and Reliability
Details
| Verlag | Springer US |
| Ersterscheinung | 09. Oktober 2016 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 972 Gramm |
| Format | Softcover |
| ISBN-13 | 9781493953981 |
| Auflage | Softcover reprint of the original 1st ed. 2015 |
| Seiten | 607 |
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