Seismic processing and imaging with diffractions: Theory and application

Seismic processing and imaging with diffractions: Theory and application

von Sergius Dell
Taschenbuch - 9783838133119
69,90 €
  • Versandkostenfrei
  • Hinweis: Print on Demand. Lieferbar innerhalb von 7 bis 10 Tagen
  • inkl. MwSt. & Versandkosten (innerhalb Deutschlands)
  • Hinweis: Print on Demand. Lieferbar innerhalb von 7 bis 10 Tagen
  • inkl. MwSt. & Versandkosten (innerhalb Deutschlands)

Autorenfreundlich Bücher kaufen?!

Beschreibung

Reflected and diffracted waves have different nature and role in the applied seismics. Diffractions itself can be classified in both real seismic and hypothetical diffractions. The real seismic diffractions are seismic waves which are scattered on small heterogeneities in the subsurface or diffracted at the edges and tips, and recorded as the diffracted part of the whole wavefield. To image objects beyond the classical Rayleigh limit, it is indispensable to use real seismic diffractions.The hypothetical diffractions are mathematical constructions resulting from Huygens principle which helps to correctly image reflected events. These Huygens diffractions build a kernel of seismic reflection imaging, particularly, Kirchhoff migration. The migrated data represent pure reflected data with a higher resolution. Considering either real or Huygens diffractions allows to adjust seismic tools for particular needs depending on the interpreter's goal and the geological interpretation. The book is intended for all who want to have a look at non-conventional seismic methods.

Details

Verlag Südwestdeutscher Verlag für Hochschulschriften AG Co. KG
Ersterscheinung Juli 2015
Maße 220 mm x 150 mm x 9 mm
Gewicht 243 Gramm
Format Taschenbuch
ISBN-13 9783838133119
Auflage Nicht bekannt
Seiten 152

Schlagwörter