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Beschreibung
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 23. August 2016 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 1253 Gramm |
| Format | Softcover |
| ISBN-13 | 9783662506011 |
| Auflage | Softcover reprint of the original 1st ed. 2011 |
| Seiten | 816 |
Schlagwörter
Biophysics, Biophysik, Characterization and Analytical Technique, Condensed Matter Physics, Elektronik, Materialwissenschaft, Microsystems and MEMS, Nanotechnologie, Nanotechnology, Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik), Surfaces - Interfaces and Thin Film, Werkstoffprüfung
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