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Hardcover - 9783540639763
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Beschreibung
Scanning Electron Microscopy
provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Physics of Image Formation and Microanalysis
Physics of Image Formation and Microanalysis
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 01. Dezember 2010 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 814 Gramm |
| Format | Softcover |
| ISBN-13 | 9783642083723 |
| Auflage | Second Edition 1998 |
| Seiten | 529 |
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