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Softcover - 9783642077784
246,09 €
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Beschreibung
In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 21. August 2002 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 765 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783540433934 |
| Seiten | 404 |
Schlagwörter
Characterization and Analytical Technique, Classical Electrodynamics, Crystallography and Scattering Methods, Elektrizität - Magnetismus und Elektromagnetismus, Energy Policy - Economics and Management, Materialwissenschaft, Optical Materials, Surfaces - Interfaces and Thin Film, Technische Anwendung von elektronischen - magnetischen - optischen Materialien, Umwelt, Werkstoffprüfung
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