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Precision Landmark Location for Machine Vision and Photogrammetry

von Brian S. R. Armstrong und José A. Gutierrez
Hardcover - 9781846289125
106,99 €
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Softcover - 9781849966740
106,99 €

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Weitere Formate

Softcover - 9781849966740
106,99 €

Beschreibung

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment and photogrammetry, among others.

This book addresses the problem of measurement error associated with determining the location of landmarks in images. The least possible photogrammetric uncertainty in a given situation is determined using the Cramér–Rao Lower Bound (CRLB).

This monograph provides the reader with: the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; detailed theoretical treatment of the CRLB; a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations; two novel algorithms which achieve precision very close to the CRLB; a method for determining the accuracy of landmark location; a downloadable MATLAB ® package to assist the reader with applying theoretically-derived results to practical engineering configurations.

Finding and Achieving the Maximum Possible Accuracy

Finding and Achieving the Maximum Possible Accuracy

Details

Verlag Springer London
Ersterscheinung 23. Oktober 2007
Maße 23.5 cm x 15.5 cm
Gewicht 436 Gramm
Format Hardcover
ISBN-13 9781846289125
Auflage 2008
Seiten 162