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Softcover - 9783642084034
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Beschreibung
The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.
Defect Studies
Defect Studies
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 21. Januar 1999 |
| Maße | |
| Gewicht | 764 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783540643715 |
| Seiten | 383 |
Schlagwörter
Characterization and Analytical Technique, Condensed Matter Physics, Crystallography and Scattering Methods, Optical Materials, Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik), Spectroscopy, Spektroskopie - Spektrochemie - Massenspektrometrie, Technische Anwendung von elektronischen - magnetischen - optischen Materialien, Werkstoffprüfung
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