Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

von R. F. Egerton
Taschenbuch - 9783319819860
85,59 €
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Hardcover - 9783319398761
85,59 €

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Weitere Formate

Hardcover - 9783319398761
85,59 €

Beschreibung

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Details

Verlag Springer International Publishing
Ersterscheinung Mai 2018
Maße 235 mm x 155 mm x 11 mm
Gewicht 322 Gramm
Format Taschenbuch
ISBN-13 9783319819860
Auflage Softcover reprint of the original 2nd ed. 2016
Seiten 208

Schlagwörter