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Beschreibung
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Volume 2
Volume 2
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 01. Oktober 2009 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 870 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783642014949 |
| Seiten | 401 |
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