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Migration Imaging of the Transient Electromagnetic Method

von Changchun Yin, Guoqiang Xue und Xiu Li
Softcover - 9789811096884
53,49 €
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Hardcover - 9789811027079
53,49 €

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Weitere Formate

Hardcover - 9789811027079
53,49 €

Beschreibung

This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM wave field methods, characteristics of the TEM virtual wave field and studies on many significant related technologies. The coverage is supplemented by a wealth of 1-D, 2-D and 3-D figures to illustrate pseudo-seismic theory. The book offers a valuable resource for teachers, students, researchers and engineers in the fields of geophysics, earth exploration and information technology.

Details

Verlag Springer Singapore
Ersterscheinung 29. Juni 2018
Maße 23.5 cm x 15.5 cm
Gewicht 242 Gramm
Format Softcover
ISBN-13 9789811096884
Auflage Softcover reprint of the original 1st ed. 2017
Seiten 139

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