Low Loss Microwave Dielectrics: Bulk and Thin Films

This book gives the over view of synthesis and characterization of low loss microwave dielectrics with the example of (Zr0.8Sn0.2)TiO4. The effect of processing parameters and smaller initial particle size on crystal structure, microstructure and on microwave dielectric properties of microwave dielectrics have been studied systematically. The microwave dielectric properties at low temperatures and the impedance spectroscopy of the microwave dielectrics have been reported. Thin films of (Zr0.8Sn0.2)TiO4 have been deposited by DC reactive magnetron sputtering from individual metal targets using single cathode along with its sub oxides (TiO2, ZrO2 and ZrTiO4). The crystal structure, microstructure, optical and electrical properties of the films are reported in detail. The dielectric properties of all the deposited films were reported both at low and at microwave frequencies. The correlations between the structure and microwave dielectric properties of (Zr0.8Sn0.2)TiO4 have been discussed both in bulk and thin film forms.