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Beschreibung
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 16. Mai 2017 |
| Maße | 22 cm x 15 cm x 1.1 cm |
| Gewicht | 286 Gramm |
| Format | Softcover |
| ISBN-13 | 9783330086937 |
| Seiten | 180 |
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