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Beschreibung
- Understand IoT software test architecture and planning
- Master IoT security testing and test techniques
- Study IoT test lab automation and architectures
- Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V
An IoT Journey from Devices to Analytics and the Edge
Details
| Verlag | APRESS |
| Ersterscheinung | 17. September 2022 |
| Maße | 25.4 cm x 17.8 cm |
| Gewicht | 655 Gramm |
| Format | Softcover |
| ISBN-13 | 9781484282755 |
| Auflage | 1st ed. |
| Seiten | 326 |