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Softcover - 9783662499658
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Beschreibung
This reference is for scientists and engineers working in the field of energy or wavelength dispersive X-ray spectrometry and related fields of basic and applied research and technology. In a concise and informative manner the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (americium). This includes X-ray energies, emission rates and widths as well as level characteristics such as binding energies, fluorescence yields, level widths and absorption edges. All important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 24. Januar 2007 |
| Maße | 24.2 cm x 19.3 cm |
| Gewicht | 2073 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783540286189 |
| Seiten | 967 |
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