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Beschreibung
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
Nano-Characterization and Coherent Control
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 17. Dezember 2013 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 530 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783642405938 |
| Seiten | 228 |
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