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Beschreibung
This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di¿raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 23. Juli 2019 |
| Maße | 22 cm x 15 cm x 0.5 cm |
| Gewicht | 107 Gramm |
| Format | Softcover |
| ISBN-13 | 9786200254405 |
| Seiten | 60 |
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