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Beschreibung
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 23. August 2016 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 5854 Gramm |
| Format | Softcover |
| ISBN-13 | 9783662510209 |
| Auflage | Softcover reprint of the original 1st ed. 2014 |
| Seiten | 363 |
Schlagwörter
B, Characterization and Analytical Technique, Characterization and Evaluation of Materials, Chemistry and Materials Science, Laser, Laserphysik, Materialwissenschaft, Optics - Lasers - Photonics - Optical Devices, Physical Chemistry, Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik), Physikalische Chemie, Surface and Interface and Thin Film, Surface and Interface Science - Thin Films, Surfaces - Interfaces and Thin Film, Surfaces and Interfaces - Thin Films, Werkstoffprüfung
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