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Electrical Characterization of ZnO thin films grown by molecular beam epitaxy

Electrical Characterization of ZnO thin films grown by molecular beam epitaxy

von Vladimir Petukhov
Softcover - 9783954040841
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Beschreibung

For the electronic and optoelectronic device realization a precise control of the electrical properties in the utilized material is a very important issue. Doping profiles in realized p-njunctions influence the functionality of the devices. The morphological and crystal properties of a device material directly influence the electrical ones. Dislocations present in a region of p-n-junctions can short circuit them leading to malfunctions. Too rough surfaces during epitaxial growth could lead to inhomogeneities in a single or multiple quantum wells and superlattices.

Details

Verlag Cuvillier
Ersterscheinung 25. April 2012
Maße 21 cm x 14.8 cm x 0.6 cm
Gewicht 157 Gramm
Format Softcover
ISBN-13 9783954040841
Seiten 112