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Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale

Hardcover - 9780792344896
53,49 €
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Softcover - 9789401064149
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Weitere Formate

Softcover - 9789401064149
53,49 €

Beschreibung

An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis.
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.

Details

Verlag Springer Netherland
Ersterscheinung 31. März 1997
Maße 23.5 cm x 15.5 cm
Gewicht 395 Gramm
Format Hardcover
ISBN-13 9780792344896
Auflage 1997
Seiten 132