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Beschreibung
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 15. Oktober 2010 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 230 Gramm |
| Format | Softcover |
| ISBN-13 | 9783642091032 |
| Auflage | Softcover reprint of hardcover 1st ed. 2008 |
| Seiten | 131 |
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