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Beschreibung
X-ray diffraction is very powerful non-destructive technique for characterizing crystalline materials. It gives information on structures, phases, preferred crystal orientations and other structural parameters, like average grain size, crystalline, strain, and crystal defects. X-ray diffraction peaks are caused by constructive interference of a monochromatic beam of X-rays scattered at particular angles from each set of lattice planes during a specimen. The peak intensities are observed by the distribution of atoms within the lattice. Consequently, the X¬ray diffraction pattern is that the fingerprint of periodic atomic arrangements during a given material. This review summarizes the scientific trends related to the rapid development of the technique of X-ray diffraction over the past five years concerning the fields of pharmaceuticals, forensic science, geological applications, and glass manufacturing, civil engineering, as well as in corrosion analysis.
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 18. August 2022 |
| Maße | 22 cm x 15 cm x 0.4 cm |
| Gewicht | 113 Gramm |
| Format | Softcover |
| ISBN-13 | 9786205492888 |
| Seiten | 64 |