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Analysis of Sensitivity and Resolution in Plasmonic Microscopes

Analysis of Sensitivity and Resolution in Plasmonic Microscopes

von Suejit Pechprasarn
Softcover - 9783659422966
59,90 €
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Beschreibung

This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral resolution and sensitivity, where an image obtained with a good contrast will have low lateral resolution. In order to get around the trade-off, the interferometric system can be employed; however, the main challenge for the interferometric setup is its optical alignment. I will show that a confocal SP microscope, which has been developed as a part of my doctoral degree, can simplify the complexity of the interferometric system and give similar measurement performance.

Details

Verlag LAP LAMBERT Academic Publishing
Ersterscheinung 14. August 2013
Maße 22 cm x 15 cm x 1.8 cm
Gewicht 441 Gramm
Format Softcover
ISBN-13 9783659422966
Seiten 284