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Analog IC Reliability in Nanometer CMOS

Analog IC Reliability in Nanometer CMOS

von Elie Maricau und Georges Gielen
Hardcover - 9781461461623
106,99 €
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Softcover - 9781489986306
106,99 €

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Weitere Formate

Softcover - 9781489986306
106,99 €

Beschreibung

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

Details

Verlag Springer US
Ersterscheinung 09. Januar 2013
Maße 23.5 cm x 15.5 cm
Gewicht 494 Gramm
Format Hardcover
ISBN-13 9781461461623
Auflage 2013
Seiten 198

Schlagwörter

Electronic Circuits and Systems, Electronics and Microelectronics - Instrumentation, Elektronik, Microsystems and MEMS, Schaltkreise und Komponenten (Bauteile)