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An Appraisal of the Characteristics of ZnO Thin Films by mSILAR Method

An Appraisal of the Characteristics of ZnO Thin Films by mSILAR Method

von Deepu Thomas
Softcover - 9786139860173
39,90 €
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Beschreibung

The third generation nanosized semiconductor materials are of paramount interest because of their multifunctional properties and applications. ZnO nanostructures have been employed for various applications ranging from electronics to optoelectronics, sensing to biomedical and environmental applications, because of their properties. The present book focuses on the synthesis, characterization, applications of ZnO thin films by mSILAR method.

Details

Verlag LAP LAMBERT Academic Publishing
Ersterscheinung 19. Februar 2019
Maße 22 cm x 15 cm x 0.6 cm
Gewicht 149 Gramm
Format Softcover
ISBN-13 9786139860173
Seiten 88