Advances in X-Ray Analysis: Volume 35B

Advances in X-Ray Analysis: Volume 35B

Taschenbuch - 9781461365327
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Beschreibung

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

Details

Verlag Springer US
Ersterscheinung November 2012
Maße 244 mm x 170 mm x 34 mm
Gewicht 1100 Gramm
Format Taschenbuch
ISBN-13 9781461365327
Auflage Softcover reprint of the original 1st ed. 1992
Seiten 648

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