Advanced Materials Characterization Techniques

Advanced Materials Characterization Techniques: Material Characterization - Electronic & Optical Properties of the Nanomaterials of Computational Science describes how computational methods and tools function to assist in resolving issues in nanoscale technology and science. The book focuses on the development of electron beam epitaxy, molecular beam epitaxy, fine line lithography, and other experimental techniques, low dimensional quantum effect devices with quantum confinements in one, two, and three dimensions of the wave vector space, such as quantum wells, metal oxide semiconductor field effect transistors, quantum wires, and quantum dots, magnetic quantization, magneto quantum size effects, magnetic inversion layers, superlattices, and field effect transistors. The electron transport in semiconductor devices is essentially determined by their respective band structures. Thus, the nature of the electronic properties become different in the aforementioned systems and varies with the magnitude of the quantizing magnetic field, the quantizing electric field and other types of quantum confined structures.