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Beschreibung
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Details
| Verlag | Springer US |
| Ersterscheinung | 31. Mai 2002 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 1450 Gramm |
| Format | Hardcover |
| ISBN-13 | 9781402070501 |
| Auflage | 2002 |
| Seiten | 320 |