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Beschreibung
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Electrical and Electromechanical Phenomena at the Nanoscale
Electrical and Electromechanical Phenomena at the Nanoscale
Details
| Verlag | Springer US |
| Ersterscheinung | 18. Dezember 2006 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 1879 Gramm |
| Format | Hardcover |
| ISBN-13 | 9780387286679 |
| Seiten | 980 |
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