Weitere Formate
Autorenfreundlich Bücher kaufen?!
Beschreibung
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Electrical and Electromechanical Phenomena at the Nanoscale
Electrical and Electromechanical Phenomena at the Nanoscale
Details
| Verlag | Springer US |
| Ersterscheinung | 04. November 2016 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 1578 Gramm |
| Format | Mehrteiliges Produkt |
| ISBN-13 | 9781493950362 |
| Auflage | Softcover reprint of the original 1st ed. 2007 |
| Seiten | 980 |
Schlagwörter
Bekannt durch
