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Beschreibung
Grating based X-ray phase contrast imaging sets out to overcome the limits of conventional X-ray imaging in the detection of subtle density differences and opens a way to characterize a sample’s microstructure without the need for ultrahigh spatial resolution. The technique relies on grating structures with micrometric periods and extreme aspect ratio – their fabrication by X-ray lithography with optimal structure quality is the topic of this work.
Details
| Verlag | KIT Scientific Publishing |
| Ersterscheinung | 16. Oktober 2017 |
| Maße | 21 cm x 14.8 cm |
| Gewicht | 325 Gramm |
| Format | Softcover |
| ISBN-13 | 9783731506799 |
| Seiten | 170 |
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