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Variability Tolerant Networks on Chip

Variability Tolerant Networks on Chip

von Eman Gawish
Softcover - 9783659660900
61,90 €
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Beschreibung

NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate.

Details

Verlag LAP LAMBERT Academic Publishing
Ersterscheinung 29. April 2015
Maße 22 cm x 15 cm x 0.9 cm
Gewicht 215 Gramm
Format Softcover
ISBN-13 9783659660900
Seiten 132

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