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Beschreibung
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
Details
| Verlag | KIT Scientific Publishing |
| Ersterscheinung | 18. Juli 2013 |
| Maße | 24 cm x 17 cm |
| Gewicht | 360 Gramm |
| Format | Softcover |
| ISBN-13 | 9783731500384 |
| Seiten | 160 |
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