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Beschreibung
-Novel insights into fundamental relationships between dielectric constant and the breakdown field of materials and related capacitance density and breakdown voltage of capacitor structures,
-Electrical characterization techniques for a wide range of frequencies (1 kHz to 20 GHz),
-Process modeling to determine stable operating points,
-Prevention of metal (Cu) diffusion into the dielectric,
-Measurements and modeling of the dielectric micro-roughness.
Details
| Verlag | Springer US |
| Ersterscheinung | 30. November 2003 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 442 Gramm |
| Format | Hardcover |
| ISBN-13 | 9781402077050 |
| Auflage | 2004 |
| Seiten | 158 |