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Beschreibung
With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
New Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 21. Mai 2010 |
| Maße | 22 cm x 15 cm x 0.8 cm |
| Gewicht | 191 Gramm |
| Format | Softcover |
| ISBN-13 | 9783838312194 |
| Seiten | 116 |
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