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Surface Microscopy with Low Energy Electrons

von Ernst Bauer
Hardcover - 9781493909346
160,49 €
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Weitere Formate

Softcover - 9781493939886
160,49 €

Autorenfreundlich Bücher kaufen?!

Weitere Formate

Softcover - 9781493939886
160,49 €

Beschreibung

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

Details

Verlag Springer US
Ersterscheinung 11. Juli 2014
Maße 23.5 cm x 15.5 cm
Gewicht 934 Gramm
Format Hardcover
ISBN-13 9781493909346
Auflage 2014
Seiten 496