Weitere Formate
Hardcover - 9780306449635
106,99 €
Autorenfreundlich Bücher kaufen?!
Beschreibung
are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.
Methods and Applications
Methods and Applications
Details
| Verlag | Springer US |
| Ersterscheinung | 22. Mai 2013 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 441 Gramm |
| Format | Softcover |
| ISBN-13 | 9781489909442 |
| Auflage | Softcover reprint of the original 1st edition 1995 |
| Seiten | 270 |
Schlagwörter
Analytical Chemistry, Analytische Chemie, Condensed Matter Physics, Crystallography and Scattering Methods, Physical Chemistry, Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik), Physikalische Chemie, Spectroscopy, Spektroskopie - Spektrochemie - Massenspektrometrie, Werkstoffprüfung
Herstellerinformationen
Bekannt durch
