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Beschreibung
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
Details
| Verlag | KIT Scientific Publishing |
| Ersterscheinung | 29. April 2025 |
| Maße | 21 cm x 14.8 cm |
| Gewicht | 400 Gramm |
| Format | Softcover |
| ISBN-13 | 9783731514022 |
| Auflage | 1. Auflage |
| Seiten | 210 |
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