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Reliability Technology for Integrated Circuit Packaging

Reliability Technology for Integrated Circuit Packaging

von Bin Zhou, Si Chen und Yunfei En
Hardcover - 9789819538843
171,19 €
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  • Hinweis: Dieser Artikel erscheint am 14. April 2026. - Jetzt vorbestellen.
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Beschreibung

This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms, advanced structures and reliability methods, with a focus on materials, structure and stress.

Reliability, a key indicator of product quality, spans multiple disciplines such as materials science and electronics. In China's pursuit of "high-quality development" a focus on reliability is essential to advancing manufacturing.

Written by a leading expert from the State Key Laboratory, this book is important for improving the performance of electronic products and supporting the growth of China's electronic information industry.

Details

Verlag Springer Singapore
Ersterscheinung 14. April 2026
Maße 23.5 cm x 15.5 cm
Format Hardcover
ISBN-13 9789819538843
Seiten 510

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