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Beschreibung
This is the first publication by me on Reliability issues of nano scale devices. As the technology is shrinking the Reliability issues increase exponentially. In this work i had evaluated the life time of a device if under the different condition. Worked on different latest devices like Silicon on Insulator(SOI) and LD MOS. We had proposed different techniques to enhance or increase the life span of devices. Because they impact the operation of different crucial application like automobile, space.
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 04. Dezember 2019 |
| Maße | 22 cm x 15 cm x 0.5 cm |
| Gewicht | 125 Gramm |
| Format | Softcover |
| ISBN-13 | 9786200325785 |
| Seiten | 72 |
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