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Beschreibung
In electronic devices, aircrafts, satellites, and other machines which are made up of a number of parts the installation process is carried out in several ways in parallel or in series depending on the type of the device. In the post-installation phase we need to measure the probability of installation errors at any stage and need to obtain the confidence limit using negative binomial distribution. The estimation of Bernoulli functions parameters is of interest in the reliability theory. In this book we look how to use Bernoulli parameters in the reliability applications
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | 02. August 2017 |
| Maße | 22 cm x 15 cm x 0.5 cm |
| Gewicht | 107 Gramm |
| Format | Softcover |
| ISBN-13 | 9783330353107 |
| Seiten | 60 |
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