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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Hardcover - 9781839682292
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Beschreibung

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Details

Verlag IntechOpen
Ersterscheinung Januar 2022
Maße 26.6 cm x 18.5 cm x 2.3 cm
Gewicht 807 Gramm
Format Hardcover
ISBN-13 9781839682292
Seiten 274