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Beschreibung
This book provides a comprehensive framework for workers in materials science, physics, chemistry, metrology and non-destructive testing, entering the field of photothermal and thermal wave techniques and can be used by those making use of these methods for a wide range of applications. The essential physics is covered from basic principles, using thermal wave analysis to gain physical insight. Each of the commonly used measurement systems is described and assessed, and the major application areas: spectroscopy; non-destructive evaluation; thermal properties measurement and semiconductor material evaluation are each reviewed.
Details
| Verlag | Springer Netherland |
| Ersterscheinung | 31. Mai 1996 |
| Maße | 22.9 cm x 15.2 cm |
| Gewicht | 376 Gramm |
| Format | Softcover |
| ISBN-13 | 9780412578809 |
| Auflage | 1996 |
| Seiten | 241 |
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