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Softcover - 9783642627729
213,99 €
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Beschreibung
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 24. Juli 2002 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 936 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783540431176 |
| Auflage | 2002 |
| Seiten | 440 |
Schlagwörter
Characterization and Analytical Technique, Characterization and Evaluation of Materials, Materialwissenschaft, Measurement Science and Instrumentation, Nanotechnologie, Nanotechnology, Surfaces - Interfaces and Thin Film, Surfaces and Interfaces - Thin Films, Werkstoffprüfung, Wissenschaftliche Standards - Normung usw.
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