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Softcover - 9783642261688
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Beschreibung
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 02. Dezember 2009 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 501 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783642031595 |
| Seiten | 182 |
Schlagwörter
Condensed Matter Physics, Elektronik, Materialwissenschaft, Measurement Science and Instrumentation, Microsystems and MEMS, Nanotechnologie, Nanotechnology, Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik), Spectroscopy, Spektroskopie - Spektrochemie - Massenspektrometrie, Surfaces - Interfaces and Thin Film, Wissenschaftliche Standards - Normung usw.
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