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Beschreibung
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Basics and Use for Evaluating Electronic Devices and Materials
Details
| Verlag | Springer International Publishing |
| Ersterscheinung | Januar 2019 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 682 Gramm |
| Format | Hardcover |
| ISBN-13 | 9783319998244 |
| Auflage | Third Edition 2018 |
| Seiten | 321 |
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